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Optimization of Low-Voltage Metallized Film Capacitor Geometry

机译:低压金属化薄膜电容器几何形状的优化

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摘要

Thermal constraint is one of the major cause of capacitor failures. In this paper, a loss model, based on electrode current distribution, is first established to determine, by numerical simulation, a temperature mapping of capacitor. This mapping is successfully compared to measurements. Then a shape optimization, coupling losses computing and finite-element method, is led in order to find parameters that give the best lifespan and the larger reactive power provided. Very interesting new geometries have been found out; they allow an increase in reactive power greater than the increase in volume.
机译:热约束是电容器故障的主要原因之一。在本文中,首先建立基于电极电流分布的损耗模型,以通过数值模拟确定电容器的温度映射。此映射已成功与测量进行比较。然后,进行形状优化,耦合损耗计算和有限元方法,以找到能够提供最佳寿命和提供更大无功功率的参数。已经发现了非常有趣的新几何形状。它们允许无功功率的增加大于体积的增加。

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