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首页> 外文期刊>IEEE Transactions on Magnetics >Read/write characteristics of Co-Zn ferrite rigid disks in contact mode recording
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Read/write characteristics of Co-Zn ferrite rigid disks in contact mode recording

机译:接触模式记录中Co-Zn铁氧体刚性磁盘的读/写特性

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Co-Zn ferrite films were deposited at substrate temperature T/sub s/ from 90 to 500/spl deg/C by using facing targets sputtering. Specimen films deposited at T/sub s/ of 200/spl deg/C and below were composed of crystallites with excellent (111) orientation and possessed a very flat surface, where the center-line average roughness R/sub a/ was 2.5 nm. The saturation magnetization 4/spl pi/M/sub s/ took a maximum value of 4.8 kG at T/sub s/ of 250/spl deg/C and the in-plane and perpendicular coercivities H/sub c/spl par// and H/sub c/spl perp// were both 1.5 kOe. A high linear recording density of 105 kFRPI was achieved for a specimen disk with Co-Zn ferrite film deposited at 200/spl deg/C by using a MIG type head with gap length of 0.27 /spl mu/m.
机译:通过使用面对靶溅射在衬底温度T / subs /从90到500 / spl deg / C沉积Co-Zn铁氧体膜。在T / sub s /为200 / spl deg / C及以下时沉积的标本薄膜由具有优异(111)取向的微晶组成,并具有非常平坦的表面,其中中心线平均粗糙度R / sub a /为2.5 nm 。饱和磁化强度4 / spl pi / M / sub s /在T / sub s /为250 / spl deg / C时的最大值为4.8 kG,面内和垂直矫顽力H / sub c / spl spar // H / sub c / spl perp //均为1.5 kOe。通过使用间隙长度为0.27 / spl mu / m的MIG型磁头,以200 / spl deg / C的温度沉积200-spl℃的Co-Zn铁氧体薄膜,可以实现105 kFRPI的高线性记录密度。

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