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Analysis of track-edge noise in thin-film recording media

机译:薄膜记录介质中轨道边缘噪声的分析

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摘要

Track-edge noise has been analyzed to clarify track-edge noise mechanisms. Edge noise arises from two different regions: the bit edge where the magnetization direction is opposite to the previously dc-erased direction and the magnetic transition edge. The edge noise at low density is mainly due to the magnetic distribution at the bit edge. The transition edge noise increases with increasing recording density, and it becomes dominant at high-recording density for an oriented medium. On the other hand, the transition edge noise is almost constant with increasing recording density for an isotropic medium.
机译:已对轨道边缘噪声进行了分析,以弄清轨道边缘噪声的机制。边缘噪声来自两个不同的区域:磁化方向与之前的dc擦除方向相反的位边缘和磁过渡边缘。低密度的边缘噪声主要归因于位边缘的磁分布。过渡边缘噪声随记录密度的增加而增加,并且在定向介质的高记录密度下它占主导地位。另一方面,对于各向同性介质,过渡边缘噪声几乎随记录密度的增加而恒定。

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