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Fault-Tolerant Network Interfaces for Networks-on-Chip

机译:片上网络的容错网络接口

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As the complexity of designs increases and technology scales down into the deep-submicron domain, the probability of malfunctions and failures in the networks-on-chip (NoCs) components increases. In this work, we focus on the study and evaluation of techniques for increasing reliability and resilience of network interfaces (NIs) within NoC-based multiprocessor system-on-chip architectures. NIs act as interfaces between intellectual property cores and the communication infrastructure; the faulty behavior of one of them could affect, therefore, the overall system. In this work, we propose a functional fault model for the NI components by evaluating their susceptibility to faults. We present a two-level fault-tolerant solution that can be employed for mitigating the effects of both permanent and temporary faults in the NI. Experimental simulations show that with a limited overhead, we can obtain an NI reliability comparable to the one obtainable by implementing the system by using standard triple modular redundancy techniques, while saving up to 48 percent in area, as well as obtaining a significant energy reduction.
机译:随着设计的复杂性增加以及技术扩展到深亚微米领域,片上网络(NoC)组件出现故障和失败的可能性也随之增加。在这项工作中,我们专注于在基于NoC的多处理器片上系统架构中提高网络接口(NI)的可靠性和弹性的技术的研究和评估。 NI充当知识产权核心与通信基础架构之间的接口;其中之一的错误行为可能会影响整个系统。在这项工作中,我们通过评估NI组件对故障的敏感性,提出了NI组件的功能故障模型。我们提出了一种两级容错解决方案,可用于减轻NI中永久性和临时性故障的影响。实验仿真表明,在有限的开销下,我们可以获得与通过使用标准三重模块冗余技术实施该系统所获得的NI可靠性相当的NI可靠性,同时节省多达48%的面积,并显着降低了能耗。

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