New Low Glitch and Low Power DET Flip-Flops Using Multiple C-Elements

摘要

This paper presents novel designs of static dual-edge-triggered (DET) flip-flops that exhibit unique circuit behavior owing to the use of C-elements. Five novel DET flip-flops are presented including two high-performance designs and designs that improve upon common Latch-MUX DET flip-flops so that none of their internal circuit nodes follow changes in the input signal. A common characteristic of the presented flip-flops is their low energy dissipation due to glitches at the input. Novel DET flip-flops are compared to existing DET flip-flops using simulation in a high performance 28 nm CMOS technology and are shown to have superior characteristics such as power and power-delay product (PDP) for a range of switching activities. Extensive Monte Carlo and voltage scaling simulations are performed to show that the presented designs are robust under PVT variations.