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Processes of AM-PM Distortion in Large-Signal Single-FET Amplifiers

机译:大信号单FET放大器中AM-PM失真的过程

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Using an appropriate formulation of field-effect transistor (FET) current as a nonlinear function of terminal voltages, and a simplified model of gain compression in common source amplifiers, we are able to identify four principal sources of amplitude-to-phase (AM-PM) distortion. A new analysis shows the varactor effect of gate-source capacitance on AM-PM distortion, and the changing Miller-multiplied gate-drain capacitance as the field-effect transistor (FET) is driven into compression. The phase shift in the load impedance at the frequency of operation and incomplete suppression of 2nd harmonic by a resonant load of limited Q are explained and analyzed. We are able to identify the dominant mechanism of AM-PM distortion in various practical circuits, which then suggests methods of remediation. The analysis was put to test by predicting the measured AM-PM distortion of power amplifiers reported in the literature. Good agreement is found in all cases, with insights gained into the dominant cause of distortion in each case.
机译:使用适当的场效应晶体管(FET)电流公式作为端电压的非线性函数,并使用通用源放大器中的增益压缩简化模型,我们能够识别出四个主要的幅度相位(AM- PM)失真。一项新的分析显示了栅极-源极电容对AM-PM失真的变容效应,并且随着场效应晶体管(FET)被压缩,不断变化的米勒乘以栅极-漏极电容。解释并分析了在工作频率下负载阻抗的相移和有限的Q谐振负载对二次谐波的不完全抑制。我们能够确定各种实际电路中AM-PM失真的主要机制,然后提出补救方法。通过预测文献中报道的功率放大器的AM-PM失真来对分析进行测试。在所有情况下都可以找到很好的一致性,并且可以洞悉每种情况下导致失真的主要原因。

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