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Architectural Exploration to Address the Reliability Challenges for ReRAM-Based Buffer in SSD

机译:解决SSD中基于ReRAM的缓冲区的可靠性挑战的体系结构探索

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Hybrid solid state drive based on ReRAM and NAND flash technologies has shown promising performance and energy efficiency. In this application, ReRAM is mainly used as a non-volatile buffer to hold recently accessed data pages or address mapping information. The previous studies on the ReRAM-based buffer mainly focus on performance and efficiency improvement, while reliability issues are not taken into consideration. Nevertheless, according to our quantitative evaluation, the limited endurance and random bit errors pose challenges to ReRAM-based buffer design. For example, without wear leveling, the raw lifetime of ReRAM-based SSD buffer may be as low as 0.02 year for some specific I/O traces. Therefore, we propose two efficient architecture techniques, i.e., multi-bloom-filter-based wear leveling and hybrid error protection, to improve the lifetime and reduce the error protection cost of ReRAM-based buffer, respectively. Simulation results demonstrate that the proposed wear leveling technique can extend the lifetime of ReRAM-based buffer by$34.7imes $on average. The proposed hybrid error protection scheme can improve the response time by at least 4.2% compared with other error protection schemes.
机译:基于ReRAM和NAND闪存技术的混合固态驱动器已显示出令人鼓舞的性能和能效。在此应用中,ReRAM主要用作非易失性缓冲区,以保存最近访问的数据页或地址映射信息。以前对基于ReRAM的缓冲区的研究主要集中在性能和效率提高上,而没有考虑可靠性问题。然而,根据我们的定量评估,有限的耐久性和随机误码对基于ReRAM的缓冲器设计提出了挑战。例如,如果没有损耗平衡,则对于某些特定的I / O轨迹,基于ReRAM的SSD缓冲区的原始寿命可能会低至0.02年。因此,我们提出了两种有效的架构技术,即基于多bloom过滤器的磨损均衡和混合错误保护,以分别提高基于ReRAM的缓冲区的寿命和降低错误保护成本。仿真结果表明,所提出的损耗均衡技术可以通过以下方式延长基于ReRAM的缓冲区的寿命: n $ 34.7 times $ 非平均。与其他错误保护方案相比,提出的混合错误保护方案可以将响应时间至少缩短4.2%。

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