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首页> 外文期刊>IEEE journal of selected topics in quantum electronics >Area selectivity of InGaAsP-InP multiquantum-well intermixing byimpurity-free vacancy diffusion
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Area selectivity of InGaAsP-InP multiquantum-well intermixing byimpurity-free vacancy diffusion

机译:无杂质空位扩散的InGaAsP-InP多量子阱混合区域选择性

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摘要

Area selectivity of bandgap tuning in the InGaAsP-InPnmultiquantum-well structure has been investigated using low temperaturenphotoluminescence (PL). The bandgap blue-shift in the intermixed regionnwas as much as 170 meV for a rapid thermal anneal of 30 s at 850°C,nand was controllable using annealing temperature and time. From samplesnwith SiO2 stripe patterns, clearly separated PL peaks werenobserved centered at 0.95 and 1.08 eV, each representing signalsnoriginating from the dielectric capped and exposed areas, respectively.nIn samples with stripes intervals less than 6 Μm, PL signals did notnseparate, but formed one broad spectrum due to lateral diffusion. Thenlateral diffusion was found less than 3.0 Μm
机译:已经使用低温n光致发光(PL)研究了InGaAsP-InPn多量子阱结构中的带隙调谐的区域选择性。对于在850°C下进行30 s的快速热退火,在混合区中的带隙蓝移高达170 meV,并且可以使用退火温度和时间来控制。从具有SiO2条纹图案的样品中,没有观察到以0.95和1.08 eV为中心的清晰分离的PL峰,每个峰分别代表从电介质覆盖和裸露区域发出的信号。n在条纹间隔小于6μm的样品中,PL信号没有分离,但形成了一个宽由于横向扩散的光谱。然后发现侧向扩散小于3.0微米

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