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首页> 外文期刊>IEEE Journal of Quantum Electronics >Design and characterization of In/sub 0.2/Ga/sub 0.8/As MQW vertical-cavity surface-emitting lasers
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Design and characterization of In/sub 0.2/Ga/sub 0.8/As MQW vertical-cavity surface-emitting lasers

机译:In / sub 0.2 / Ga / sub 0.8 / As MQW垂直腔面发射激光器的设计与表征

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摘要

The device design, material characterization, and performance of optimized vertical-cavity surface-emitting lasers (VCSELs) are presented. The basic design goal was to increase the output power of the lasers without greatly increasing the low threshold current reported in earlier devices. The material characterization was performed by measuring in-plane lasers and broad-area VCSELs made from the same material as the small VCSELs. For 10- mu m-square devices, outputs over 3 mW, device operation over 100 degrees C, 6% wall-plug efficiency, threshold voltages under 3 V, and threshold currents under mA are reported.
机译:介绍了优化的垂直腔面发射激光器(VCSEL)的器件设计,材料表征和性能。基本设计目标是在不大大增加早期设备中报告的低阈值电流的情况下增加激光器的输出功率。通过测量面内激光器和由与小型VCSEL相同的材料制成的广域VCSEL进行材料表征。对于10平方微米的设备,报告的输出超过3 mW,设备在100摄氏度以上运行,墙插效率为6%,阈值电压低于3 V,阈值电流低于mA。

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