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Carrier capture and relaxation in narrow quantum wells

机译:窄量子阱中的载流子捕获和弛豫

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In separate confined heterostructure (SCH) lasers, injected electrons and holes thermalize into a quantum well after diffusion through the outer cladding layers. The carriers move towards equilibrium by emitting optical phonons. In narrow quantum wells, as compared to the 1-2 ps required in bulk semiconductors, this phonon emission process can be considerably slowed down due to the 2-D density of states and the nature of the electron-optical phonon interaction. This process has been studied theoretically using a Monte Carlo program which allows us to see the carrier distribution as a function of time. Typical times for carrier relaxation are 10-15 ps for a 50 /spl Aring/ GaAs well with Al/sub 0.30/Ga/sub 0.70/As barriers and /spl sim/5 pS for a 200 /spl Aring/ well. These calculations have been complemented by time-resolved photoluminescence measurements on SCH structures where the relaxation time from a 3D distribution into In/sub 0.20/Ga/sub 0.80/As/GaAs wells is measured at T=200 K. Carrier relaxation times of 50, 41, 22, and 17 ps are obtained for wells of sizes 30, 40, 50, and 100 /spl Aring/, respectively. The results show clearly that the use of narrow quantum wells in low threshold lasers will pose a serious limitation to the efficiency and small-signal modulation bandwidth of these devices.
机译:在单独的有限异质结构(SCH)激光器中,注入的电子和空穴在通过外覆层扩散后会热化成量子阱。载流子通过发射光子来达到平衡。与体半导体中所需的1-2 ps相比,在窄量子阱中,由于状态的2D密度和电子-电子声子相互作用的性质,该声子发射过程会大大减慢。理论上已经使用蒙特卡洛程序研究了该过程,该程序允许我们将载波分布视为时间的函数。载流子弛豫的典型时间是50 / spl Aring / GaAs阱为10-15 ps,而Al / sub 0.30 / Ga / sub 0.70 / As势垒为200 / spl Aring /阱为/ spl sim / 5 pS。这些计算得到了SCH结构上时间分辨光致发光测量的补充,其中在T = 200 K时测量了从3D分布到In / sub 0.20 / Ga / sub 0.80 / As / GaAs阱的弛豫时间。载流子弛豫时间为50分别为30、40、50和100 / spl Aring /的井分别获得41,22、22 ps和17 ps的流量。结果清楚地表明,在低阈值激光器中使用窄量子阱将严重限制这些设备的效率和小信号调制带宽。

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