Optimization of multiplane μPIV for wall shear stress and wall topography characterization

摘要

Multiplane μPIV can be utilized to determine the wall shear stress and wall topology from the measured flow over a structured surface. A theoretical model was developed to predict the measurement error for the surface topography and shear stress, based on a theoretical analysis of the precision in PIV measurements. The main parameters that affect the accuracy of the measurement are identified. The effect of different parameter settings is studied by means of Monte Carlo simulations, and the results are compared with an experimental test case. The results are used to determine the recommended parameter settings for this measurement approach.