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Experimental investigation into vortex structure and pressure drop across microcavities in 3D integrated electronics

机译:3D集成电子器件中涡旋结构和微腔内压降的实验研究

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Hydrodynamics in microcavities with cylindrical micropin fin arrays simulating a single layer of a water-cooled electronic chip stack is investigated experimentally. Both inline and staggered pin arrangements are investigated using pressure drop and microparticle image velocimetry (μPIV) measurements. The pressure drop across the cavity shows a flow transition at pin diameter–based Reynolds numbers (Re d ) ~200. Instantaneous μPIV, performed using a pH-controlled high seeding density of tracer microspheres, helps visualize vortex structure unreported till date in microscale geometries. The post-transition flow field shows vortex shedding and flow impingement onto the pins explaining the pressure drop increase. The flow fluctuations start at the chip outlet and shift upstream with increasing Re d . No fluctuations are observed for a cavity with pin height-to-diameter ratio h/d = 1 up to Re d ~330; however, its pressure drop was higher than for a cavity with h/d = 2 due to pronounced influence of cavity walls.
机译:实验研究了圆柱形微针鳍阵列在微腔中的流体动力学,模拟了单层水冷电子芯片堆栈。使用压降和微粒图像测速(μPIV)测量来研究串联销和交错销的布置。整个腔内的压降显示出在基于销直径的雷诺数(Re d )〜200时的流动过渡。瞬时μPIV使用示踪剂微球的pH值控制的高接种密度进行,有助于可视化直至至今尚未报告的微尺度几何形状的涡旋结构。过渡后的流场显示出涡流脱落和流撞击到销上,从而说明了压降的增加。流量波动从切屑出口开始,并随着Re d 的增加而向上游移动。销钉高度与直径之比h / d = 1直至Re d 〜330的腔体均未观察到波动。然而,由于腔壁的显着影响,其压降高于h / d = 2的腔。

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