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Designing DUT Boards for IC Test

机译:设计用于IC测试的DUT板

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Testing a new IC design is a critical step in the transition from product development to production. device-under-test (DUT) board is a key component of the test interface unit (see sidebar), and it serves as the interconnection between the test socket or contactor and the ATE test head. Because the DUT board is at the center of the test system, designing and producing one that delivers accurate and reliable test results require complete knowledge of: 1. The IC package to be tested. 2. The various test sockets or contactors that can be mounted on the board to interface with the IC package. 3. The various test heads to which the DUT board can connect. 4. The automated handling equipment used in the ATE system.
机译:测试新的IC设计是从产品开发到生产过渡的关键步骤。被测设备(DUT)板是测试接口单元的关键组件(请参见侧栏),它用作测试插座或接触器与ATE测试头之间的互连。由于DUT板位于测试系统的中心,因此设计和生产能够提供准确可靠的测试结果的板需要以下方面的完整知识:1.要测试的IC封装。 2.可以安装在板上以与IC封装接口的各种测试插座或接触器。 3. DUT板可以连接到的各种测试头。 4. ATE系统中使用的自动化处理设备。

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