Nanofocus AG, developer and manufacturer of optical 3D surface measuring technology, has introduced a new measuring system μsprint hp-opc 3000 for the optical inspection of probe cards within the framework of the IS-Test Workshop in Munich. μsprint hp-opc 3000 enables an innovative and future-oriented process step in wafer production. The process is specially designed for the requirements of wafer test locations with a variety of different probe cards as well as large-volume throughput. A pilot system is already installed at a renowned manufacturer of semiconductor elements.
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