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Investigation of etalon effects in GaAs-AlGaAs multiple quantum well modulators

机译:GaAs-AlGaAs多量子阱调制器中的标准具效应研究

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The authors have simulated the modulation properties in transmission and reflection of an electrically active Fabry-Perot etalon containing a GaAs-AlGaAs multiple quantum well pin structure. The calculations are based on measurements of room temperature electro-absorption in a nonresonant device, rather than an empirical model, and generate the optimum values of modulation for any given etalon by selection of the appropriate cavity length. It is found that improved modulation can be obtained compared to the non-resonant device, mainly due to multiple-pass electro-absorption. For example, a device with front and back mirror reflectivities of 0.3 and 0.9 respectively, and a 1 mu m thick multiple quantum well structure, shows a change in reflection from about 75% to 10% at approximately=865 nm when biased from 0 to -10 V. To obtain even higher changes in transmission or reflection and to utilise the electro-refractive properties of the material, high finesse cavities are needed. This however, appears to impose severe constraints on the epitaxial growth accuracy and operational stability of such devices.
机译:作者已经模拟了包含GaAs-AlGaAs多量子阱引脚结构的电活性Fabry-Perot标准具的透射和反射调制特性。该计算基于非谐振设备中室温电吸收的测量,而不是经验模型,并通过选择适当的腔体长度来生成任何给定标准具的最佳调制值。已经发现,与非谐振装置相比,可以获得改进的调制,这主要是由于多次通过电吸收。例如,前反射镜和后反射镜的反射率分别为0.3和0.9,以及1微米厚的多量子阱结构的器件,当从0偏移到0时,在大约= 865 nm处反射率从大约75%变为10%。 -10V。为了获得更高的透射率或反射率变化并利用材料的电折射特性,需要高精细的腔体。然而,这似乎对这种器件的外延生长精度和操作稳定性施加了严格的限制。

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