机译:一种使用动态短路测量技术的1.2 kV SiC MOSFET的高温表征
Hong Kong Univ Sci & Tech Dept Elect & Comp Engn Hong Kong Peoples R China;
Zhejiang Univ Coll Elect Engn Hangzhou 310027 Peoples R China;
Zhejiang Univ Coll Elect Engn Hangzhou 310027 Peoples R China;
Hong Kong Univ Sci & Tech Dept Elect & Comp Engn Hong Kong Peoples R China;
Zhejiang Univ Coll Elect Engn Hangzhou 310027 Peoples R China;
Zhejiang Univ Coll Elect Engn Hangzhou 310027 Peoples R China;
Hong Kong Univ Sci & Tech Dept Elect & Comp Engn Hong Kong Peoples R China;
Channel mobility; high temperature characterization; silicon carbide (SiC) power MOSFET; threshold voltage;
机译:在1.2-kV SiC JBS集成MOSFET中调查短路测试的失效机制
机译:重复短路测试下1.2 kV 4H-SiC MOSFET的退化研究
机译:短路事件对1.2kV / 20A SiC MOSFET电源模块的功率循环的影响
机译:1.2 KV 19-A SiC功率MOSFET的短路降解及其机理研究。
机译:6H-αSiC的热氧化电钝化及其表征和在SiC MOSFET中的应用。
机译:多芯片SIC MOSFET模块多物理仿真辅助光学测量的热阻抗表征
机译:高温反应堆燃料颗粒上SiC和PyC涂层的先进表征技术