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首页> 外文期刊>Embedded Systems Letters, IEEE >Fault Classification for SRAM-Based FPGAs in the Space Environment for Fault Mitigation
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Fault Classification for SRAM-Based FPGAs in the Space Environment for Fault Mitigation

机译:空间环境中基于SRAM的FPGA的故障分类以减轻故障

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摘要

This letter proposes a classification algorithm to discriminate between recoverable and not recoverable faults occurring in static random access memory (SRAM)-based field-programmable gate arrays (FPGAs), with the final aim of devising a methodology to enable the exploitation of these devices also in space applications, typically characterized by long mission times, where permanent faults become an issue. By starting from a characterization of the radiation effects and aging mechanisms, we define a controller able to classify such faults and consequently to apply the appropriate mitigation strategy.
机译:这封信提出了一种分类算法,以区分在基于静态随机存取存储器(SRAM)的现场可编程门阵列(FPGA)中发生的可恢复故障与不可恢复故障,最终目的是设计一种方法来实现对这些设备的利用在太空应用中,通常具有较长的任务时间,永久性故障成为一个问题。通过表征辐射效应和老化机制,我们定义了一个能够对此类故障进行分类并因此应用适当的缓解策略的控制器。

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