Because of the continual miniaturisation of electronic components, there are challenging requirements in the production process as well as quality assurance. Since electric test technologies are harder to utilise, Automated Optical Inspection becomes more important as a qualitative test method.rnHowever, due to the structures getting smaller and smaller, the highest requirements are required for the image capturing and processing within such a system.rnBasics of detail recognitionrnThe application of CCD-matrix cameras within an AOI system has become established as quasi-standard. Compared to scanner solutions, AOI systems with area scan cameras are more flexible and offer a lower optical distortion at a higher resolution.rnAOI systems' recognition output is often evaluated in pixel resolution with the unit μm/Pixel' - regardless of how the image was captured. But this size is rather a theoretical value, for which the impact of critical lens parameters such as diffraction or aberration is not considered. A considerable contribution to detail recognition lays with the design of the optical system as well as the way it combines to the applied CCD-matrix.
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