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Delay-locked loop technique for temperature stabilisation of internal delays of CMOS FPGA devices

机译:延迟锁定环路技术可稳定CMOS FPGA器件内部延迟的温度

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摘要

A delay-locked loop (DLL) technique for use with typical CMOS field programmable gate array (FPGA) devices is presented. It allows for temperature stabilisation of the internal delays of the devices, especially when the digital delay lines are designed. The voltage V/sub cc/ supplying the FPGA device is varied within a limited range by the DLL to stabilise the internal delays of the device under changes in the ambient temperature. The method is illustrated by presenting results of the realisation of an interpolating time counter with 200 ps resolution, implemented on a single CMOS FPGA device.
机译:提出了一种用于典型CMOS现场可编程门阵列(FPGA)器件的延迟锁定环(DLL)技术。它允许设备内部延迟的温度稳定,尤其是在设计数字延迟线时。通过DLL在有限的范围内改变提供给FPGA器件的电压V / sub cc /,以在环境温度变化时稳定器件的内部延迟。通过展示在单个CMOS FPGA器件上实现的具有200 ps分辨率的内插时间计数器的实现结果来说明该方法。

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