首页> 外文期刊>Electronicsletters >Discard wide-baseline mismatch using contour fragments
【24h】

Discard wide-baseline mismatch using contour fragments

机译:使用轮廓片段丢弃宽基线不匹配

获取原文
获取原文并翻译 | 示例

摘要

A method to discard wide-baseline mismatches, which is based on the consistence of local contour fragments between two matched regions, is presented. Experimental results show that the proposed approach can efficiently extract high-precision matches from low-precision initial SIFT matches and performs best, or close to best, in comparison with state-of-the-art methods.
机译:提出了一种基于两个匹配区域之间局部轮廓片段的一致性来丢弃宽基线不匹配的方法。实验结果表明,与最新方法相比,该方法可以从低精度初始SIFT匹配中高效提取高精度匹配,并且执行效果最佳或接近最佳。

著录项

  • 来源
    《Electronicsletters》 |2010年第12期|P.834-835|共2页
  • 作者单位

    Huazhong University of Science and Technology, Institute for Pattern Recognition and Artificial Intelligence, State Key Laboratory for Multi-spectral Information Processing Technologies, Wuhan 430074, People's Republic of China;

    rnHuazhong University of Science and Technology, Institute for Pattern Recognition and Artificial Intelligence, State Key Laboratory for Multi-spectral Information Processing Technologies, Wuhan 430074, People's Republic of China;

    rnHuazhong University of Science and Technology, Institute for Pattern Recognition and Artificial Intelligence, State Key Laboratory for Multi-spectral Information Processing Technologies, Wuhan 430074, People's Republic of China;

    rnHuazhong University of Science and Technology, Institute for Pattern Recognition and Artificial Intelligence, State Key Laboratory for Multi-spectral Information Processing Technologies, Wuhan 430074, People's Republic of China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号