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首页> 外文期刊>Electronics Letters >High-voltage superjunction VDMOS with low reverse recovery loss
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High-voltage superjunction VDMOS with low reverse recovery loss

机译:具有低反向恢复损耗的高压超结VDMOS

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摘要

A new design of the high-voltage superjunction VDMOS (SJ-VDMOS) structure is proposed to minimise the reverse recovery losses of the body diode and the noise during the switching process. The key feature of the structure is that a discontinuous P+ region in the source is implemented which can decrease the carrier injection efficiency. Numerical results indicate that the reverse recovery charge and the overshoot voltage of the proposed structure is decreased by 76.5% and 52.5%, respectively, compared to the conventional SJ-VDMOS structure, while maintaining the same breakdown voltage.
机译:提出了一种高压超结VDMOS(SJ-VDMOS)结构的新设计,以最小化体二极管的反向恢复损耗和开关过程中的噪声。该结构的关键特征是在源极中实现了不连续的P + 区域,这会降低载流子注入效率。数值结果表明,与传统的SJ-VDMOS结构相比,该结构的反向恢复电荷和过冲电压分别降低了76.5%和52.5%,同时保持了相同的击穿电压。

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