首页> 外文期刊>Electronics Letters >Frequency response of an internal amplifier in a high-speed integrated circuit measured by electro-optic sampling
【24h】

Frequency response of an internal amplifier in a high-speed integrated circuit measured by electro-optic sampling

机译:通过电光采样测量高速集成电路中内部放大器的频率响应

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

The frequency response of an FET amplifier within a high-speed GaAs integrated circuit has been measured directly using ultrashort optical pulses from a gain-switched GaInAsP injection laser and the electro-optic sampling technique. The 3 dB bandwidth for the FET amplifier is 4-4.5 GHz.
机译:高速GaAs集成电路中FET放大器的频率响应已直接使用来自增益开关GaInAsP注入激光器的超短光脉冲和电光采样技术进行了测量。 FET放大器的3 dB带宽为4-4.5 GHz。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号