Since its ratification in the early 1990s, the IEEE 1149.1 Boundary Scan (JTAG) specification has shown that a well-thought-out standard can be resilient, adaptive, and quite useful in applications that were never considered during its development. Still a workhorse in non-invasive structural testing, boundary scan has expanded its role significantly over the years, becoming the base technology for several tag-along standards such as IEEE 1149.6 for high-speed serial bus testing and IEEE 1532 for in-sys-tem programming. The latest, and perhaps most significant, application for boundary scan is emerging now as semiconductor vendors and system manufacturers embed functionality into chips in what is becoming known as embedded instrumentation.
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