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首页> 外文期刊>IEEE Transactions on Electron Devices >Steady state characterization of an optically controlled p-i-n diode for low frequency switching under front/back illumination
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Steady state characterization of an optically controlled p-i-n diode for low frequency switching under front/back illumination

机译:前/后照明下用于低频开关的光控P-I-N二极管的稳态特性

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This paper describes the determination of the steady state operating characteristics of an optically controlled Si p-i-n illuminated from either top or bottom for varying electrode spacings and conducting layer thicknesses. Optically controlled p-i-n diodes have previously been used in both microwave and pulsed power applications and are now being considered for use in high-power, low-frequency (60 Hz) switching such as Static Var Compensators.
机译:本文描述了确定从顶部或底部照射的光控Si p-i-n的稳态工作特性,以改变电极间距和导电层厚度的情况。光控p-i-n二极管以前曾用于微波和脉冲功率应用,现在正考虑用于高功率,低频(60 Hz)开关,例如静态无功补偿器。

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