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首页> 外文期刊>IEEE Transactions on Electron Devices >Theoretical Investigation of Negative Differential Conductance Regime of Silicon Nanocrystal Single-Electron Devices
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Theoretical Investigation of Negative Differential Conductance Regime of Silicon Nanocrystal Single-Electron Devices

机译:硅纳米晶体单电子器件的负微分电导率制度的理论研究

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摘要

he current-voltage characteristics of metal-insulator-Si quantum dot (QD)-insulator-metal structures are numerically simulated to investigate the design and the possible applications of single-electron devices taking advantage of Coulomb-blockade phenomenon. The simulation technique is based on a physical description of the devices and only requires fundamental quantities of the system but no fitting parameter. One of the originality of this work lies in the accurate calculation of tunneling rates by a perturbation method, which allows us to properly include the effect of a bias voltage on the wave functions in the QD. As a consequence, we show that the bias influence on the wave function may lead to negative-differential-conductance effects depending on the design of the structure.
机译:数值模拟了金属-绝缘体-硅量子点(QD)-绝缘体-金属结构的电流-电压特性,以研究利用库仑阻塞现象的单电子器件的设计及其可能的应用。仿真技术基于设备的物理描述,仅需要系统的基本数量,而无需拟合参数。这项工作的独创性之一在于通过扰动方法精确计算隧穿速率,这使我们能够适当地包括偏置电压对QD中波函数的影响。结果,我们表明,根据结构的设计,对波函数的偏置影响可能会导致负微分电导效应。

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