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首页> 外文期刊>Electron Devices, IEEE Transactions on >Reply to Comments on “1.88-$hbox{m}Omega cdot hbox{cm}^{2}$ 1650-V Normally on 4H-SiC TI-VJFET”
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Reply to Comments on “1.88-$hbox{m}Omega cdot hbox{cm}^{2}$ 1650-V Normally on 4H-SiC TI-VJFET”

机译:对“ 1.88- $ hbox {m} Omega cdot hbox {cm} ^ {2} $ 1650-V通常在4H-SiC TI-VJFET上的评论”的答复

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摘要

The arguments presented in the above comments are refuted. The following are pointed out: 1) Veliadis' papers did not include the vertical-junction field-effect transistor (VJFET) dimensions required for readers to make technical analysis and comparison. 2) The current through the gate p-n junction of a VJFET is also affected by the ohmic contact and metal spreading resistance; therefore, the external gate terminal voltage alone does not determine whether a VJFET is operated in bipolar mode or not. 3) A longer vertical channel with a more invariant or uniform vertical-channel opening makes it much easier to realize higher performance and higher voltage normally-off JFETs because of the lower channel resistance and the larger drain voltage needed to punch through the drain-to-source barrier.
机译:驳斥了以上评论中提出的论点。需要指出以下几点:1)Veliadis的论文没有包括读者进行技术分析和比较所需的垂直结场效应晶体管(VJFET)尺寸。 2)通过VJFET的栅极p-n结的电流也受到欧姆接触和金属扩散电阻的影响;因此,仅外部栅极端子电压并不能确定VJFET是否以双极性模式工作。 3)较长的垂直沟道具有不变的或均匀的垂直沟道开口,这使实现更高的性能和更高电压的常关JFET变得容易得多,这是因为较低的沟道电阻和更大的漏极电压需要穿透漏极至源障碍。

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