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Pseudospectral Methods for the Efficient Simulation of Quantization Effects in Nanoscale MOS Transistors

机译:伪谱方法可有效模拟纳米级MOS晶体管的量化效应

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摘要

This paper presents an in-detail investigation of the possible advantages related to the use of the pseudospectral (PS) method for the efficient description of the carrier quantization in nanoscale n- and p-MOS transistors. To this purpose, we have implemented, by using both the finite-difference (FD) and PS methods, self-consistent Schrödinger–Poisson solvers for both a 2-D hole gas described by a ${bf k} cdot {bf p}$ Hamiltonian (suitable for p-MOSFETs) and a 1-D electron gas in the effective-mass approximation (for n-type fin-shaped FETs and nanowire FETs). The PS and FD methods have been systematically compared in terms of the CPU time and the number of discretization points by monitoring not only the subband energies in the low-dimensional carrier gas but also the calculation of some scattering matrix elements that are critically important for the transport modeling. Our results indicate a remarkable reduction in the CPU time for the PS method with respect to the FD method, which makes the PS method very attractive for the modeling of the carrier quantization in nanoscale MOSFETs.
机译:本文详细研究了与使用伪光谱(PS)方法相关的可能优势,以有效描述纳米级n和p-MOS晶体管中的载流子量化。为此,我们通过使用有限差分(FD)和PS方法,实现了由$ {bf k} cdot {bf p}描述的二维空穴气体的自洽Schrödinger-Poisson求解器哈密​​顿量(适用于p-MOSFET)和有效质量近似中的一维电子气(适用于n型鳍形FET和纳米线FET)。通过不仅监视低维载气中的子带能量,而且还计算了一些对于散射至关重要的散射矩阵元素,对PS和FD方法在CPU时间和离散点数量方面进行了系统地比较。运输模型。我们的结果表明,相对于FD方法,PS方法的CPU时间显着减少,这使得PS方法对于纳米级MOSFET载流子量化的建模非常有吸引力。

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