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Investigation of Hole-Blocking Contacts for High-Conversion-Gain Amorphous Selenium Detectors for X-Ray Imaging

机译:用于X射线成像的高转换增益非晶硒探测器的空穴阻挡触点的研究

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In this paper, we investigated different organic and inorganic hole-blocking contacts for amorphous selenium (a-Se)-based photodetectors: $hbox{CeO}_{2}$, $hbox{TiO}_{2}$, perylene tetracarboxylic bisbenzimidazole (PTCBI), and polyimide (PI). $hbox{CeO}_{2}$ has previously been used as a blocking layer for high-gain a-Se devices. $hbox{TiO}_{2}$ has similar properties to $hbox{CeO}_{2}$. PTCBI has a higher ionization potential compared to a-Se and has a very low hole mobility. PI is a common insulator in the semiconductor industry. It was found that an 800-nm PI layer reduces the dark current by more than two orders of magnitude in comparison with 30 nm of $hbox{CeO}_{2}$, 20 nm of $hbox{TiO}_{2}$, and 50 nm of PTCBI. No significant charge trapping was found in the devices consisting of an 800-nm PI layer. Unlike previously reported inorganic hole-blocking contact technology, PI layers further benefit from a simple spin coating fabrication step before evaporation of a-Se. Photodetector samples incorporating the PI layer are tested at high electric fields, and gains reaching 4.4 were observed at an electric field $>hbox{80} hbox{V}/mu hbox{m}$. We conclude that using a PI layer is a promising step in the development of high-conversion-gain detectors for emerging applications in large-area medical diagnostic imaging, crystallography, and nondestructive test.
机译:在本文中,我们研究了基于非晶硒(a-Se)的光电探测器的不同有机和无机空穴阻挡接触:$ hbox {CeO} _ {2} $,$ hbox {TiO} _ {2} $,per四羧酸双苯并咪唑(PTCBI)和聚酰亚胺(PI)。 $ hbox {CeO} _ {2} $以前曾被用作高增益a-Se器件的阻挡层。 $ hbox {TiO} _ {2} $与$ hbox {CeO} _ {2} $具有相似的属性。 PTCBI与a-Se相比具有更高的电离电势,并且空穴迁移率非常低。 PI是半导体行业中常见的绝缘体。已经发现,与30 nm的$ hbox {CeO} _ {2} $,20 nm的$ hbox {TiO} _ {2}相比,800 nm的PI层将暗电流减小了两个数量级以上。 $和50 nm的PTCBI。在由800 nm PI层组成的器件中没有发现明显的电荷陷阱。与先前报道的无机空穴阻挡接触技术不同,PI层还受益于蒸发a-Se之前的简单旋涂制造步骤。在高电场下测试了包含PI层的光电检测器样品,在电场$> hbox {80} hbox {V} / mu hbox {m} $下观察到的增益达到4.4。我们得出结论,在大面积医学诊断成像,晶体学和无损检测的新兴应用中,使用PI层是开发高转换增益检测器的有希望的一步。

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