机译:不同的栅极偏置和栅极长度对AlGaN / GaN异质结构FET的寄生源极访问电阻的影响
School of Microelectronics, Shandong University, Jinan, China;
School of Mathematics, Shandong University, Jinan, China;
Department of Physics, University of Alberta, Edmonton, AB, Canada;
School of Microelectronics, Shandong University, Jinan, China;
School of Mathematics, Shandong University, Jinan, China;
School of Microelectronics, Shandong University, Jinan, China;
School of Microelectronics, Shandong University, Jinan, China;
School of Microelectronics, Shandong University, Jinan, China;
National Key Laboratory of Application Specific Integrated Circuit, Hebei Semiconductor Research Institute, Shijiazhuang, China;
Key Laboratory of Pulsed Power, Institute of Fluid Physics, China Academy of Engineering Physics, Mianyang, China;
Logic gates; Aluminum gallium nitride; Wide band gap semiconductors; Scattering; HEMTs; MODFETs; Resistance;
机译:栅极长度与栅极 - 排水距离对不同温度的源进出距离影响的栅极漏极距离影响
机译:极化库仑场散射对AlGaN / GaN异质结FET中寄生源访问电阻和本征跨导的影响
机译:栅源间距对AIGaN / GaN异质结构场效应晶体管中寄生源访问电阻的影响
机译:施主层掺杂,厚度,栅极长度和温度对AlGaN / GaN双异质结构和单异质结构HEMT中电势和电子浓度的影响
机译:研究常关模式的AlGaN / GaN MOS HEMT器件,该器件利用栅极后退和p-GaN栅极结构以及带有醛生长的高k栅极绝缘体来实现高功率应用。
机译:栅极长度与漏极-源极距离之比对AlGaN / AlN / GaN异质结构场效应晶体管中电子迁移率的影响
机译:栅极长度与漏极至源极距离之比对AlGaN / AlN / GaN异质结构场效应晶体管中电子迁移率的影响
机译:利用无缺陷栅极凹陷和激光退火改善alGaN / GaN / si mOsFET的器件性能和可靠性。