首页> 外文期刊>Electron Devices, IEEE Transactions on >FeCAM: A Universal Compact Digital and Analog Content Addressable Memory Using Ferroelectric
【24h】

FeCAM: A Universal Compact Digital and Analog Content Addressable Memory Using Ferroelectric

机译:FECAM:使用铁电的通用紧凑数字和模拟内容可寻址存储器

获取原文
获取原文并翻译 | 示例

摘要

Ferroelectric field effect transistors (FeFETs) are being actively investigated with the potential for in-memory computing (IMC) over other nonvolatile memories (NVMs). Content addressable memories (CAMs) are a form of IMC that performs parallel searches for matched entries over a memory array for a given input query. CAMs are widely used for data-centric applications that involve pattern matching and search functionality. To accommodate the ever expanding data, it is attractive to resort to analog CAM for memory density improvement. However, the digital CAM design nowadays based on standard CMOS or emerging NVMs (e.g., resistive storage devices) is already challenging due to area, power, and cost penalties. Thus, it can be extremely expensive to achieve analog CAM with those technologies due to added cell components. As such, we propose, for the first time, a universal compact FeFET-based CAM design, FeCAM, with search and storage functionality enabled in digital and analog domains simultaneously. By exploiting the multilevel-cell (MLC) states of FeFET, FeCAM can store and search inputs in either digital or analog domain. We perform a device-circuit codesign of the proposed FeCAM and validate its functionality and performance using an experimentally calibrated FeFET model. Circuit level simulation results demonstrate that FeCAM can either store continuous matching ranges or encode 3-bit data in a single CAM cell. When compared with the existing digital CMOS-based CAM approaches, FeCAM is found to improve both memory density by $22.4imes $ and energy saving by $8.6imes / 3.2imes $ for analog/digital modes, respectively. In the CAM-related application, our evaluations show that FeCAM can achieve $60.5imes / 23.1imes $ saving in area/search energy compared with conventional CMOS-based CAMs.
机译:在其他非易失性存储器(NVMS)上,正在主动研究铁电场效应晶体管(FFFET)。内容可寻址存储器(CAM)是IMC的一种形式,其对给定输入查询的存储器阵列上的匹配条目执行并行搜索。 CAMS广泛用于涉及模式匹配和搜索功能的数据为中心的应用程序。为了适应不断扩展的数据,诉诸于模拟凸轮的内存密度改进是有吸引力的。然而,现在基于标准CMOS或出现NVMS(例如,电阻存储设备)的数字凸轮设计已经由于面积,功率和成本惩罚已经具有挑战性。因此,通过添加的细胞组分,通过这些技术实现模拟凸轮可以非常昂贵。因此,我们提出了一个通用的基于Compact FEFET的CAM设计,FECAM,同时在数字和模拟域中启用了搜索和存储功能。通过利用FFFET的多级单元(MLC)状态,FECAM可以存储和搜索数字或模拟域中的输入。我们执行所提出的FECAM的设备电路代码,并使用实验校准的FEFET模型验证其功能和性能。电路电平仿真结果表明,FECAM可以在单个凸轮单元中存储连续匹配范围或编码3位数据。与现有的基于CMOS的凸轮方法相比,发现FECAM以提高内存密度<内联公式XMLNS:MML =“http://www.w3.org/1998/math/mathml”xmlns:xlink =“http://www.w3.org/1999/xlink”> $ 22.4 times $ 节能<内联公式XMLNS:MML =“http://www.w3.org/1998/math/mathml”xmlns:xlink =“http://www.w3.org/1999/xlink”> $ 8.6 times / 3.2 times $ 对于模拟/数字模式。在CAM相关的应用中,我们的评估表明FECAM可以实现<内联公式XMLNS:MML =“http://www.w3.org/1998/math/mathml”xmlns:xlink =“http://www.w3.org/1999/xlink”> $ 60.5 times / times / 23.1 times $ 与基于传统的CMOS的凸轮相比,在区域/搜索能量中保存。

著录项

  • 来源
    《Electron Devices, IEEE Transactions on》 |2020年第7期|2785-2792|共8页
  • 作者单位

    College of Information Science and Electronic Engineering Zhejiang University Hangzhou China;

    College of Information Science and Electronic Engineering Zhejiang University Hangzhou China;

    College of Information Science and Electronic Engineering Zhejiang University Hangzhou China;

    College of Information Science and Electronic Engineering Zhejiang University Hangzhou China;

    Department of Computer Science and Engineering University of Notre Dame Notre Dame IN USA;

    Department of Computer Science and Engineering University of Notre Dame Notre Dame IN USA;

    College of Information Science and Electronic Engineering Zhejiang University Hangzhou China;

    Department of Microsystems Engineering Rochester Institute of Technology Rochester NY USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Nonvolatile memory; Capacitors; Associative memory; Performance evaluation; Magnetic tunneling;

    机译:非易失性存储器;电容;关联记忆;性能评估;磁隧道;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号