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Write-Once–Read-Many-Times Memory Based on ZnO on p-Si for Long-Time Archival Storage

机译:基于ZnO在p-Si上的一次写入-多次读取存储器,用于长时间归档存储

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摘要

Write-once–read-many-times memory cells were fabricated using ZnO thin film on p-Si (111) substrate. The off- and on-state resistance ratio is over $hbox{10}^{4}$ and can be well sustained for more than 100 years and perfectly endure reading cycles of $hbox{10}^{8}$ . The conducting filaments consisting of oxygen vacancies are responsible for the switching mechanism.
机译:在p-Si(111)衬底上使用ZnO薄膜制造了一次写入多次读取存储单元。断态和导通状态的电阻比超过$ hbox {10} ^ {4} $,并且可以很好地维持100多年以上,并且完全可以承受$ hbox {10} ^ {8} $的读取周期。由氧空位组成的导电丝负责开关机制。

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