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A multi-label classification model for full slice brain computerised tomography image

机译:全面分类模型全面脑电电脑层面图像图像

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Abstract Background Screening of the brain computerised tomography (CT) images is a primary method currently used for initial detection of patients with brain trauma or other conditions. In recent years, deep learning technique has shown remarkable advantages in the clinical practice. Researchers have attempted to use deep learning methods to detect brain diseases from CT images. Methods often used to detect diseases choose images with visible lesions from full-slice brain CT scans, which need to be labelled by doctors. This is an inaccurate method because doctors detect brain disease from a full sequence scan of CT images and one patient may have multiple concurrent conditions in practice. The method cannot take into account the dependencies between the slices and the causal relationships among various brain diseases. Moreover, labelling images slice by slice spends much time and expense. Detecting multiple diseases from full slice brain CT images is, therefore, an important research subject with practical implications. Results In this paper, we propose a model called the slice dependencies learning model (SDLM). It learns image features from a series of variable length brain CT images and slice dependencies between different slices in a set of images to predict abnormalities. The model is necessary to only label the disease reflected in the full-slice brain scan. We use the CQ500 dataset to evaluate our proposed model, which contains 1194 full sets of CT scans from a total of 491 subjects. Each set of data from one subject contains scans with one to eight different slice thicknesses and various diseases that are captured in a range of 30 to 396 slices in a set. The evaluation results present that the precision is 67.57%, the recall is 61.04%, the F1 score is 0.6412, and the areas under the receiver operating characteristic curves (AUCs) is 0.8934. Conclusion The proposed model is a new architecture that uses a full-slice brain CT scan for multi-label classification, unlike the traditional methods which only classify the brain images at the slice level. It has great potential for application to multi-label detection problems, especially with regard to the brain CT images.
机译:摘要背景筛选脑计算机层面摄影(CT)图像是目前用于初始检测脑创伤或其他条件的患者的主要方法。近年来,深度学习技术在临床实践中表现出显着的优势。研究人员试图使用深度学习方法来检测来自CT图像的脑疾病。通常用于检测疾病的方法选择来自全切片脑CT扫描的可见病变的图像,需要由医生标记。这是一种不准确的方法,因为医生从CT图像的全序扫描中检测到脑疾病,并且一个患者在实践中可能具有多个并发条件。该方法不能考虑各种脑病之间的切片与因果关系之间的依赖关系。此外,通过切片标记图像切片花费了很多时间和费用。因此,检测来自全切片脑CT图像的多种疾病是具有实际意义的重要研究主题。结果本文提出了一种称为切片依赖性学习模型(SDLM)的模型。它从一组图像中的不同切片之间的一系列可变长度脑CT图像和切片依赖性了解图像特征,以预测异常。该模型是仅标记在全切片脑扫描中反映的疾病的必要条件。我们使用CQ500 DataSet评估我们所提出的模型,其中包含1194个全套CT扫描,总共有491个科目。来自一个受试者的每组数据包含扫描,其中一到八种不同的片厚度和各种疾病,在一组中捕获的范围为30到396个切片。评估结果显示,精度为67.57%,召回是61.04%,F1得分为0.6412,接收器操作特性曲线(AUC)下的区域为0.8934。结论拟议的模型是一种新的架构,它是一种用于多标签分类的全切脑CT扫描,与只在切片水平上分类大脑图像的传统方法不同。它对多标签检测问题的应用具有很大的潜力,特别是关于脑CT图像。

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