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Structural characterization of individual graphene sheets formed by arc discharge and their growth mechanisms

机译:电弧放电形成的单个石墨烯片的结构表征及其生长机制

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摘要

Graphene sheets formed by arc discharge are hard to characterize in detail due to their complex pristine states in raw soot, which always exhibit an overall morphology of overlapping aggregation, together with other carbonaceous by-products. Here we used an improved arc method and simple separation procedure to obtain a large number of individual graphene sheets with single- to few-layers, and further probed their structural details using optical microscopy, transmission electron microscopy (TEM), atomic force microscopy and Raman spectroscopy. By TEM characterization, two major types of graphene sheets are shown; one is observed with folded fringes and polycrystalline structure, whereas the other is with an even graphene plane and single crystalline structure. In contrast to that of supported graphene, the Raman spectra of these graphene sheets show some different characteristics such as opposite shift of G band frequency as the layers increase. With increasing layers, the frequencies of G and G′ bands and the full width at half maximum (FWHM) of the G′ band totally exhibit layer-dependence. According to the FWHM of G′ bands, the folding within graphene sheets is also discussed. In addition, the defect types for arc graphene are analysed based on the D and D′ bands. Our results suggest that the D bands of such graphene sheets result from edges, rather than topological defects or disorder. Based on the findings, a new growth mechanism of arc graphene is proposed rationally responsible for the difference of two types of graphene sheets.
机译:由于其在原始烟灰中的复合原始状态,通过弧形排出形成的石墨烯片很难详细表征,其总是表现出与其他碳质副产物的重叠聚集的整体形态。在这里,我们使用了改进的电弧方法和简单的分离过程,获得大量具有单次到几层的单独石墨烯片,并使用光学显微镜,透射电子显微镜(TEM),原子力显微镜和拉曼进一步探测其结构细节光谱学。通过TEM表征,示出了两种主要类型的石墨烯片;用折叠的条纹和多晶硅结构观察一个,而另一个是均匀的石墨烯平面和单晶结构。与支持的石墨烯相反,这些石墨烯片的拉曼光谱显示出一些不同的特征,例如随着层的增加而相反的频率偏移。随着层的增加,G和G'带的频率和G'带的半最大(FWHM)的全宽度完全表现出层依赖性。根据G'带的FWHM,还讨论了石墨烯片内的折叠。另外,基于D和D'频带分析弧形石墨烯的缺陷类型。我们的结果表明,这种石墨烯片的D带由边缘而不是拓扑缺陷或病症。基于调查结果,建议合理地负责两种类型的石墨烯片的差异的新增长机制。

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