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An assessment on crystallization phenomena of Si in Al/a-Si thin films via thermal annealing and ion irradiation

机译:通过热退火和离子照射对Al / A-Si薄膜结晶现象的评估

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In the present study, crystallization of amorphous-Si (a-Si) in Al/a-Si bilayer thin films under thermal annealing and ion irradiation has been investigated for future solar energy materials applications. In particular, the effect of thickness ratio ( e.g. in Al?:?a-Si, the ratio of the Al and a-Si layer thickness) and temperature during irradiation on crystallization of the Si films has been explored for the first time. Two sets of samples with thickness ratio 1?:?1 (set-A: 50 nm Al/50 nm a-Si) and thickness ratio 1?:?3 (set-B: 50 nm Al/150 nm a-Si) have been prepared on thermally oxidized Si-substrates. In one experiment, thermal annealing of the as-prepared sample (of both the sets) has been done at different temperatures of 100 °C, 200 °C, 300 °C, 400 °C, and 500 °C. Significant crystallization was found to initiate at 200 °C with the help of thermal annealing, which increased further by increasing the temperature. In another experiment, ion irradiation on both sets of samples has been carried out at 100 °C and 200 °C using 100 MeV Ni ~(7+) ions with fluences of 1 × 10 ~(12) ions per cm ~(2) , 5 × 10 ~(12) ions per cm ~(2) , 1 × 10 ~(13) ions per cm ~(2) , and 5 × 10 ~(13) ions per cm ~(2) . Significant crystallization of Si was observed at a remarkably low temperature of 100 °C under ion irradiation. The samples irradiated at 100 °C show better crystallization than the samples irradiated at 200 °C. The maximum crystallization of a-Si has been observed at a fluence of 1 × 10 ~(12) ions per cm ~(2) , which was found to decrease with increasing ion fluence at both temperatures ( i.e. 100 °Cand200 °C). The crystallization of a-Si is found to be better for set-B samples as compared to set-A samples at all the fluences and irradiation temperatures. The present work is aimed at developing the understanding of the crystallization process, which may have significant advantages for designing crystalline layers at lower temperature using appropriate masks for irradiation at the desired location. The detailed mechanisms behind all the above observations are discussed in this paper.
机译:在本研究中,对未来的太阳能材料应用,研究了Al / A-Si双层薄膜中的Al / A-Si双层薄膜中的无定形Si(A-Si)的结晶。特别地,首次探讨了厚度比(例如,在Alα:Δ:Δ:Δa-si,Al和a-si层厚度的比率)和温度的辐射期间的Si膜的结晶期间的温度。两组具有厚度比1的样品1?:1(设定-A:50nm Al / 50nm A-Si)和厚度比1?:α3(Set-B:50nm Al / 150nm A-Si)已经在热氧化的Si-基材上制备。在一个实验中,在100℃,200℃,300℃,400℃和500℃的不同温度下进行了制备的样品(两组的样品)的热退火。发现显着的结晶在热退火的帮助下在200℃下引发,通过增加温度进一步增加。在另一个实验中,使用100meV Ni〜(7+)离子在100℃和200℃下进行的两组样品上的离子照射,每厘米的1×10〜(12)离子流量为1×10〜(12)离子〜(2) ,每厘米〜(2),每厘米〜(2),1×10〜(13)离子,每厘米5×10〜(13)离子,5×10〜(13)离子〜(2)。在离子辐射下在100℃的低温下观察到Si的显着结晶。在100℃下照射的样品显示比在200℃下照射的样品更好的结晶。已经在每厘米〜(2)的1×10〜(12)离子的流量下观察到A-Si的最大结晶,这被发现随着在两个温度(即100°Cand200℃)的温度下的增加而降低。发现A-Si的结晶与在所有流量和照射温度的样品中相比,对Set-B样品更好。本作本作的旨在开发对结晶过程的理解,这对于使用适当的掩模在所需位置照射的适当掩模可以具有显着的晶体层。本文讨论了所有上述观察结果背后的详细机制。

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