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Granulometric composition study of mineral resources using opto-electronic devices and Elsieve software system

机译:光电设备和ELSieve软件系统矿物资源粒度组成研究

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The use of mechanical sieves has a great impact on measurement results because occurrence of anisometric particles causes undercounting the average size. Such errors can be avoided by using opto-electronic measuring devices that enable measurement of particles from 10 μm up to a few dozen millimetres in size. The results of measurement of each particle size fraction are summed up proportionally to its weight with the use of Elsieve software system and for every type of material particle-size distribution can be obtained. The software allows further statistical interpretation of the results. Beam of infrared radiation identifies size of particles and counts them precisely. Every particle is represented by an electronic impulse proportional to its size. Measurement of particles in aqueous suspension that replaces the hydrometer method can be carried out by using the IPS L analyser (range from 0.2 to 600 μm). The IPS UA analyser (range from 0.5 to 2000 μm) is designed for measurement in the air. An ultrasonic adapter enables performing measurements of moist and aggregated particles from 0.5 to 1000 μm. The construction and software system allow to determine second dimension of the particle, its shape coefficient and specific surface area. The AWK 3D analyser (range from 0.2 to 31.5 mm) is devoted to measurement of various powdery materials with subsequent determination of particle shape. The AWK B analyser (range from 1 to 130 mm) measures materials of thick granulation and shape of the grains. The presented method of measurement repeatedly accelerates and facilitates study of granulometric composition.
机译:机械筛的使用对测量结果产生了很大的影响,因为发生致多测量粒子的发生导致平均尺寸。通过使用光电测量装置可以避免这种误差,使能量为10μm的粒度尺寸为10μm。每个粒度级分的测量结果与使用ELSieve软件系统的重量比例地求和,并且可以获得每种类型的材料粒度分布。该软件允许对结果进行进一步的统计解释。红外辐射束识别粒子的尺寸并精确地对它们进行计数。每个颗粒由与其尺寸成比例的电子脉冲表示。通过使用IPS L分析仪(范围为0.2至600μm),将替换液相含水悬浮液中的颗粒的测量。 IPS UA分析仪(范围为0.5到2000μm),设计用于空气中的测量。超声波适配器使得能够从0.5至1000μm执行湿润和聚集颗粒的测量。施工和软件系统允许确定颗粒的第二尺寸,其形状系数和比表面积。 AWK 3D分析仪(范围为0.2至31.5毫米),用于测量各种粉末材料,随后测定颗粒形状。 AWK B分析仪(范围为1到130毫米)测量粗粒的粗造粒和形状的材料。呈现的测量方法反复加速和促进粒状组合物的研究。

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