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Emerging Nonvolatile Memories to Go Beyond Scaling Limits of Conventional CMOS Nanodevices

机译:新兴的非易失性记忆超出传统CMOS纳米赛的缩放限制

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摘要

Continuous dimensional scaling of the CMOS technology, along with its cost reduction, has rendered Flash memory as one of the most promising nonvolatile memory candidates during the last decade. With the Flash memory technology inevitably approaching its fundamental limits, more advanced storage nanodevices, which can probably overcome the scaling limits of Flash memory, are being explored, bringing about a series of new paradigms such as FeRAM, MRAM, PCRAM, and ReRAM. These devices have indeed exhibited better scaling capability than Flash memory while also facing their respective physical drawbacks. The consequent tradeoffs therefore drive the information storage device technology towards further advancement; as a result, new types of nonvolatile memories, including carbon memory, Mott memory, macromolecular memory, and molecular memory have been proposed. In this paper, the nanomaterials used for these four emerging types of memories and the physical principles behind the writing and reading methods in each case are discussed, along with their respective merits and drawbacks when compared with conventional nonvolatile memories. The potential applications of each technology are also briefly assessed.
机译:CMOS技术的连续尺寸缩放,以及其成本降低,使闪存呈现为过去十年中最有前途的非易失性记忆候选之一。随着闪存技术不可避免地接近其基本限制,正在探索可能克服闪存的缩放限制的更先进的存储纳米型,这是一系列新的范式,如Feram,MRAM,PCRAM和RERAM。这些设备的确实表现出比闪存更好的缩放能力,同时也面临其各自的物理缺点。因此,随后的权衡驱动信息存储设备技术进一步进步;结果,已经提出了新类型的非易失性存储器,包括碳记忆,MOTT记忆,大分子记忆和分子记忆。在本文中,讨论了这四种新出现的存储器和在每种情况下写作和阅读方法背后的物理原理的纳米材料,以及与传统的非易失性存储器相比的各自的优点和缺点。每个技术的潜在应用也是简要评估的。

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