Fundamental Problems of Hybrid CMOS/Nanodevice Circuits.

摘要

This project was focused on key fundamental issues of future hybrid CMOS/nanodevice circuits: (i) optimization of metal-oxide devices with resistive bistability, and (ii) design and simulation of single-electron molecular latching switches. The report describes the significant progress made in both directions, including - fabrication of bistable TiOx devices with yield up to 70% and endurance up to 103 cycles, - design and characterization of single-electron molecular latching switches, and - design and fabrication of a CMOS subsystem for hybrid integration.