Using atomic-force microscopy techniques for an analysis of ferroelectric and magnetic properties of bismuth-doped terbium manganite at low temperatures

摘要

Magnetic and ferroelectric properties of the doped single crystal Tb0.95Bi0.05MnO3 have been investigated using magnetic force microscopy and piezoresponse force microscopy in the temperature range of 4 – 30 K. Local magnetic and ferroelectric ordering in the Tb0.95Bi0.05MnO3 crystal was observed at low temperatures. An absence of correlation in distribution of ferromagnetic clusters and polar nanodomain areas was found in the temperature range of 4 – 30 K.