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Direct measurement on the geometric phase of a double quantum dot qubit via quantum point contact device

机译:通过量子点接触装置直接测量双量子点量子比特的几何相位

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We propose a direct measurement scheme to read out the geometric phase of a coupled double quantum dot system via a quantum point contact(QPC) device. An effective expression of the geometric phase has been derived, which relates the geometric phase of the double quantum dot qubit to the current through QPC device. All the parameters in our expression are measurable or tunable in experiment. Moreover, since the measurement process affects the state of the qubit slightly, the geometric phase can be protected. The feasibility of the scheme has been analyzed. Further, as an example, we simulate the geometrical phase of a qubit when the QPC device is replaced by a single electron transistor(SET).
机译:我们提出了一种直接测量方案,以通过量子点接触(QPC)设备读出耦合的双量子点系统的几何相位。得出了几何相位的有效表达式,该表达式将双量子点量子比特的几何相位与通过QPC器件的电流相关联。在实验中我们表达式中的所有参数都是可测量的或可调的。此外,由于测量过程会稍微影响量子位的状态,因此可以保护几何相位。分析了该方案的可行性。此外,作为一个示例,当QPC器件被单个电子晶体管(SET)代替时,我们模拟了量子位的几何相位。

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