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Effect of Repeat Copy Number on Variable-Number Tandem Repeat Mutations in Escherichia coli O157:H7

机译:重复拷贝数对大肠杆菌O157:H7中可变数串联重复序列突变的影响

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Variable-number tandem repeat (VNTR) loci have shown a remarkable ability to discriminate among isolates of the recently emerged clonal pathogen Escherichia coli O157:H7, making them a very useful molecular epidemiological tool. However, little is known about the rates at which these sequences mutate, the factors that affect mutation rates, or the mechanisms by which mutations occur at these loci. Here, we measure mutation rates for 28 VNTR loci and investigate the effects of repeat copy number and mismatch repair on mutation rate using in vitro-generated populations for 10 E. coli O157:H7 strains. We find single-locus rates as high as 7.0 × 10?4 mutations/generation and a combined 28-locus rate of 6.4 × 10?4 mutations/generation. We observed single- and multirepeat mutations that were consistent with a slipped-strand mispairing mutation model, as well as a smaller number of large repeat copy number mutations that were consistent with recombination-mediated events. Repeat copy number within an array was strongly correlated with mutation rate both at the most mutable locus, O157-10 (r2 = 0.565, P = 0.0196), and across all mutating loci. The combined locus model was significant whether locus O157-10 was included (r2 = 0.833, P < 0.0001) or excluded (r2 = 0.452, P < 0.0001) from the analysis. Deficient mismatch repair did not affect mutation rate at any of the 28 VNTRs with repeat unit sizes of >5 bp, although a poly(G) homomeric tract was destabilized in the mutS strain. Finally, we describe a general model for VNTR mutations that encompasses insertions and deletions, single- and multiple-repeat mutations, and their relative frequencies based upon our empirical mutation rate data.
机译:可变数目串联重复序列(VNTR)位点已显示出显着的能力来区分最近出现的克隆病原体大肠杆菌 O157:H7的分离株,使其成为非常有用的分子流行病学工具。但是,对于这些序列突变的速率,影响突变速率的因素或在这些基因座发生突变的机制知之甚少。在这里,我们测量了28个VNTR基因座的突变率,并使用体外产生的10 E种群研究了重复拷贝数和错配修复对突变率的影响。大肠杆菌O157:H7菌株。我们发现单基因座发生率高达7.0×10 ?4 突变/世代,组合28位基因发生率高达6.4×10 ?4 突变/世代。我们观察到与重复链错配突变模型一致的单重复和多重复突变,以及与重组介导的事件一致的少量大重复拷贝数突变。阵列中的重复拷贝数与突变率最高的突变位点密切相关,O157-10( r 2 = 0.565, P = 0.0196),并且在所有突变基因座上均如此。无论是否包括O157-10位( r 2 = 0.833, P <0.0001),还是排除了(分析得出r 2 = 0.452, P <0.0001)。尽管在 mutS 菌株中poly(G)同源链不稳定,但错配修复不足对28个重复单元大小大于5 bp的VNTR的突变率均没有影响。最后,我们根据经验突变率数据描述了一个VNTR突变的通用模型,该模型包括插入和缺失,单重复和多重复突变及其相对频率。

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