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Analysis of oxidation degree of graphite oxide and chemical structure of corresponding reduced graphite oxide by selecting different-sized original graphite

机译:通过选择不同尺寸的原始石墨来分析氧化石墨的氧化程度和相应的还原氧化石墨的化学结构

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The thermal exfoliation and reduction of graphite oxide (GO) is the most commonly used strategy for large-scale preparation of graphene, and the oxidation degree of GO would influence the chemical structure of prepared graphene, thereby affecting its final physical and chemical properties. In addition to serving as the precursor for synthesizing graphene, GO also possesses great potential for various important applications owing to its abundant oxygen-containing groups and hybrid electronic structure. Therefore, systematically studying the influencing factors on the oxidation degree of GO and clarifying the effect of oxidation degree on the corresponding graphene is particularly important. Herein, we have studied the effect of the lateral size of the original graphite on the oxidation degree of GO in order to control the oxidation degree of GO. GOs with different degrees of oxidation were synthesized using a modified Hummers method. The results of X-ray diffraction (XRD), X-ray photoelectron spectra (XPS) and Raman spectroscopy revealed that decreased lateral size of the original graphite would lead to increased oxidation degree of GO. Furthermore, the interlayer spacing of the GO samples achieved 0.9–1.0 nm, which indicated that the modified Hummers method could make well oxidized graphite. The corresponding reduced graphite oxide (rGO) was also prepared by low-temperature exfoliation of GO at 140 °C under ambient atmosphere. It was found that a larger lateral size of GO resulted in rGO with fewer oxygen-containing functional groups, but a smaller lateral size of graphite possessed a higher exfoliation degree with a larger specific surface area. More importantly, the relationship between binding energy ( E _(B) ) of photoelectron of C atom in oxygen-containing groups and the number of oxygen-containing groups in GO and rGO samples was analyzed theoretically.
机译:热剥落和还原氧化石墨(GO)是大规模制备石墨烯的最常用策略,GO的氧化程度会影响所制备石墨烯的化学结构,从而影响其最终的物理和化学性质。除了用作合成石墨烯的前​​体外,GO还具有丰富的含氧基团和杂化电子结构,因此在各种重要应用中也具有巨大潜力。因此,系统地研究GO氧化程度的影响因素,弄清氧化程度对相应石墨烯的影响尤为重要。在此,我们研究了原始石墨的横向尺寸对GO氧化度的影响,以控制GO的氧化度。使用改进的Hummers方法合成具有不同氧化程度的GO。 X射线衍射(XRD),X射线光电子能谱(XPS)和拉曼光谱的结果表明,原始石墨的横向尺寸减小将导致GO的氧化度增加。此外,GO样品的层间距达到0.9-1.0 nm,这表明改进的Hummers方法可以制备出良好氧化的石墨。还通过在环境气氛下在140°C下对GO进行低温剥离来制备相应的还原型氧化石墨(rGO)。发现GO的较大横向尺寸导致具有较少含氧官能团的rGO,但是较小的石墨横向尺寸具有较高的剥落度和较大的比表面积。更重要的是,从理论上分析了含氧基团中C原子的光电子的电子结合能(E _(B))与GO和rGO样品中含氧基团数之间的关系。

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