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Memristive behavior in In2Se3 asymmetrical hetero-structures

机译:In 2 Se 3 不对称异质结构中的忆阻行为

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Based on Ag/In2Se3/ITO and Ta/In2Se3/ITO asymmetrical heterostructures, several memristive samples were prepared by the magnetron sputtering method. The In2Se3 core layer is in the γ-phase, as determined by XRD and Raman spectroscopy measurements. Current–voltage measurements reveal the bipolar resistive switching characteristics at room temperature. The underlying mechanism can be well interpreted by the space-charge limited conduction effect with redistribution and migration of charged defects responsible for the switching effect. The achieved bipolar resistive switching behaviour of the In2Se3 samples can be adjusted by transforming different electrodes. It seems to be a promising candidate in prospective nonvolatile memory and neuromorphic circuit applications.
机译:基于Ag / In 2 Se 3 / ITO和Ta / In 2 < / sub> Se 3 / ITO不对称异质结构,采用磁控溅射法制备了多个忆阻样品。通过XRD和拉曼光谱测量确定In 2 Se 3 核心层处于γ相。电流电压测量揭示了室温下的双极性电阻开关特性。可以通过空间电荷有限的传导效应以及负责开关效应的带电缺陷的重新分布和迁移来很好地解释其潜在机理。 In 2 Se 3 样品实现的双极电阻切换行为可以通过变换不同的电极来调节。在潜在的非易失性存储器和神经形态电路应用中,它似乎是一个有前途的候选者。

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