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Performance Comparison of CMOS and Finfet Based Circuits At 45nm Technology Using SPICE

机译:使用SPICE在45nm技术下基于CMOS和Finfet的电路的性能比较

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According to the Moore's Law, the number of transistors in a unit chip area double every two years. But the existing technology of integrated circuit formation is posing limitations to this law. CMOS technology shows certain limitations as the device is reduced more and more in the nanometer regime out of which power dissipation is an important issue. FinFET is evolving to be a promising technology in this regard. This paper aims to analyze and compare the characteristics of CMOS and FinFET circuits at 45nm technology. Inverter circuit is implemented in order to study the basic characteristics such as voltage transfer characteristics, leakage current and power dissipation. Further the efficiency of FinFET to reduce power as compared to CMOS is proved using SRAM circuit. The results show that the average power is reduced by 92.93% in read operation and by 97.8% in write operation.
机译:根据摩尔定律,单位芯片面积中的晶体管数量每两年翻一番。但是现有的集成电路形成技术对该法构成了限制。 CMOS技术显示出某些局限性,因为该器件在纳米范围内越来越多地被缩小,其中功耗是一个重要的问题。 FinFET在这方面正在发展成为有前途的技术。本文旨在分析和比较45nm技术下CMOS和FinFET电路的特性。为了研究诸如电压传输特性,泄漏电流和功率耗散的基本特性,实施了逆变器电路。此外,使用SRAM电路证明了FinFET与CMOS相比降低功率的效率。结果表明,在读取操作中平均功率降低了92.93%,在写入操作中降低了97.8%。

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