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Comparison of Logic Performance of CMOS Circuits Implemented With Junctionless and Inversion-Mode FinFETs

机译:无结和反相模式FinFET实现的CMOS电路的逻辑性能比较

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摘要

In this paper, we report the logic performance of CMOS circuits implemented with n- and p-channel junctionless (JL) FinFETs. A one-to-one comparison of the performance is made between such circuits and those implemented with n- and p-channel conventional inversion-mode (IM) FinFETs. The logic performance of a CMOS inverter is evaluated in terms of rise time and fall time for three different future technology nodes with the help of extensive 3-D device and mixed-mode circuit simulators. Frequency of oscillation of a three-stage ring oscillator (RO) is also obtained for such nodes. In spite of reduced ON-state current arising out of the higher channel doping and, hence, reduced carrier mobility in the JL devices, somewhat improved performance of the JL CMOS circuits over their IM counterparts are observed. For example, improvement of ~28% and ~10% in the rise time and fall time, respectively, for the inverter and ~12% in the frequency of oscillation of RO are observed for 10-nm technology node. Our investigations reveal reduced gate capacitance of the JL devices that in turn result in such improved performance of the JL CMOS circuits. Reduced gate capacitance also results in reduced dynamic power dissipation of JL CMOS circuits.
机译:在本文中,我们报告了使用n通道和p通道无结(JL)FinFET实现的CMOS电路的逻辑性能。在此类电路与使用n通道和p通道常规反向模式(IM)FinFET实施的电路之间进行了一对一的性能比较。借助广泛的3D器件和混合模式电路仿真器,可以针对三个不同的未来技术节点,根据上升时间和下降时间来评估CMOS反相器的逻辑性能。对于此类节点,也可以获得三级环形振荡器(RO)的振荡频率。尽管由于较高的沟道掺杂而导致导通状态电流减小,并因此降低了JL器件的载流子迁移率,但观察到JL CMOS电路的性能比其IM同类产品有所改善。例如,对于10纳米技术节点,逆变器的上升时间和下降时间分别提高了约28%和10%,RO的振荡频率提高了约12%。我们的研究表明,JL器件的栅极电容降低,进而导致JL CMOS电路的性能得到改善。降低的栅极电容还可以降低JL CMOS电路的动态功耗。

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