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首页> 外文期刊>Bulletin of the Korean Chemical Society >Determination of Doping Density in GaAs Semiconductor by Wavelength-Dependent Photoacoustic Spectroscopy
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Determination of Doping Density in GaAs Semiconductor by Wavelength-Dependent Photoacoustic Spectroscopy

机译:波长相关光声光谱法测定GaAs半导体中的掺杂密度

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The wavelength dependence of the photoacoustic signal for n-type GaAs semiconductors in the region of the band-gap energies was investigated. The significant changes in the phase and amplitude of the photoacoustic signal near the band-gap absorption wavelengths were observed to occur when the Si-doping densities in GaAs were varied. Particularly, the first derivatives of the photoacoustic phase vs. wavelength graphs were evaluated and fitted with single Gaussian functions. The peak centers and the widths of the Gaussian curves clearly showed linear relationships with the log values of the Si-doping densities in n-type GaAs semiconductors. It is proposed that the wavelength-dependent PA spectroscopy can be used as a simple and nondestructive method for measuring the doping densities in bulk semiconductors.
机译:研究了在带隙能量区域内n型GaAs半导体的光声信号的波长依赖性。当改变GaAs中的Si掺杂密度时,观察到了在带隙吸收波长附近的光声信号的相位和幅度的显着变化。特别是,对光声相位与波长关系图的一阶导数进行了评估,并拟合了单个高斯函数。高斯曲线的峰中心和宽度清楚地显示出与n型GaAs半导体中Si掺杂密度的对数值的线性关系。提出了依赖于波长的PA光谱可以用作一种简单且无损的方法来测量体半导体中的掺杂密度。

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