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Oxygen Adsorption Process on ZnO Single Crystal

机译:ZnO单晶上的氧吸附过程

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The adsorption of oxygen on ZnO was monitored by measuring the capacitance of two contacting crystals which have depletion layers originated from the interaction between oxygen and ZnO at 298 K-473 K. An admission of oxygen to the sample induced an irreversible increase in the depth and the amount of adsorbed oxygen was less than 0.001 monolayer in the experimental condition. The relation between pressure of oxygen and variation of the depth was tested from the view point of Langmuir or Freundlich isotherm. Using Hall effect measurement and kinetic experiment, a model equation on the adsorption process was proposed. From the results, it was suggested that oxygen adsorption depended on the rate of electron transfer from ZnO to oxygen while the amount of adsorbed oxygen was kinetically restricted by the height of surface potential barrier.
机译:通过测量两个接触晶体的电容来监测氧在ZnO上的吸附,这两个接触晶体的耗尽层是在298 K-473 K时氧与ZnO之间的相互作用产生的。样品中氧的引入导致深度和厚度的不可逆增加。在实验条件下,氧的吸附量小于0.001单层。从Langmuir或Freundlich等温线的角度测试了氧气压力与深度变化之间的关系。利用霍尔效应测量和动力学实验,提出了吸附过程的模型方程。从结果表明,氧的吸附取决于电子从ZnO转移到氧的速率,而氧的吸附量在动力学上受表面势垒高度的限制。

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