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首页> 外文期刊>Bulletin of the Korean Chemical Society >The Effect of Unprecracked Hydride on the Growth and Carbon Incorporation in GaAs Epilayer on GaAs(100) by Chemical Beam Epitaxy
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The Effect of Unprecracked Hydride on the Growth and Carbon Incorporation in GaAs Epilayer on GaAs(100) by Chemical Beam Epitaxy

机译:未裂解氢化物对化学束外延生长在GaAs(100)上GaAs外延层中生长和碳结合的影响

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We have grown GaAs epilayers by chemical beam epitaxy(CBE) using unprecracked hydrides and metal organic compounds via a surface decomposition process. This result shows that unprecracked arsine (AsH3) or monoethylarsine (MEAs) can be used in chemical beam epitaxy(CBE) as a replacement of a precracked AsH3 source in CBE. It was also found that the uptake of carbon impurity in epilayers grown using trimethylgallium(TMG) with unprecracked AsH3 or MEAs was significantly reduced compared to that in epilayers grown by CBE process employing TMG and arsenics produced from precracked hydrides. We propose a surface structural model suggesting that the hydrogen atoms play an important role in the reduction of carbon content in GaAs epilayer. Intermediates like dihydrides from hydride sources were also considered to hinder carbon atoms from being incorporated into the epilayers or to remove other carbon containing species on the surface.
机译:我们已经使用未裂解的氢化物和金属有机化合物通过表面分解工艺通过化学束外延(CBE)生长了GaAs外延层。该结果表明未裂解的砷化氢(AsH3)或单乙基ethyl(MEAs)可用于化学束外延(CBE)中,以替代CBE中的裂解的AsH3源。还发现,与使用TMG和由预裂解氢化物生产的砷的CBE工艺所生长的外延层相比,使用三甲基镓(TMG)与未裂解的AsH3或MEAs生长的外延层中碳杂质的吸收显着降低。我们提出了一种表面结构模型,表明氢原子在GaAs外延层的碳含量降低中起着重要作用。还认为诸如氢化物来源的二氢化物之类的中间体会阻碍碳原子掺入表层或去除表面上的其他含碳物质。

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