...
首页> 外文期刊>Journal of Physics: Conference Series >Wavefront measurement based feedback control for automatic alignment of a high-NA optical system
【24h】

Wavefront measurement based feedback control for automatic alignment of a high-NA optical system

机译:基于波前测量的反馈控制,用于高NA光学系统的自动对准

获取原文

摘要

Many applications of optical systems depend on focal spot quality, which depends on the alignment of the optical components. During alignment, it is difficult to monitor the spot quality because the spot position shifts with the alignment. This paper proposes to compensate for displacements of the focal spot and to monitor the spot quality by controlling the position of a Shack-Hartmann sensor. Low-order aberration data is used to control the position of a Shack-Hartmann sensor while higher-order aberrations are used to estimate focal spot quality. An experimental high numerical aperture setup is presented and the proposed method is applied. The experimental results successfully demonstrate the automatic alignment capabilities.
机译:光学系统的许多应用取决于焦点质量,焦点质量取决于光学组件的对准。在对准期间,由于点位置随对准而移动,因此难以监视点质量。本文提出通过控制Shack-Hartmann传感器的位置来补偿焦点的位移并监视斑点质量。低阶像差数据用于控制Shack-Hartmann传感器的位置,而高阶像差用于估计焦点质量。提出了一种实验性的高数值孔径设置并应用了所提出的方法。实验结果成功证明了自动对准功能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号