Device for full extent of wavefront in arbitrary optical system of ophthalmic lenses and optical instruments for use in optical metrology, has principle measurement base for local determination of wavefront direction

摘要

The device has a principle measurement base for local determination of wavefront direction simultaneously in a series of continuous groups positions so that the complete set of positions intercepts completely to wavefront to be measured to make a thorough sampling of wavefront. An independent claim is also included for a method for full extent of wavefront in arbitrary optical system.