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首页> 外文期刊>Journal of Ovonic Research >Photoelectrical properties of semiconducting amorphous Se-Te-Sb thin films
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Photoelectrical properties of semiconducting amorphous Se-Te-Sb thin films

机译:半导体非晶态Se-Te-Sb薄膜的光电性能

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摘要

The electrical properties of Se70Te30-xSbx (x = 0, 2, 4, 6, 8) amorphous thin films preparedby thermal evaporation technique have been studied. The dark conductivity (σd), chargecarrier concentration (nσ) and photoconductivity (σph) increases as the concentration of Sbadditive increases upto x = 6 at. % in a-Se70Te30-xSbx thin films. The activation energy(ΔΕ) and photosensitivity (σph/σd) decreases sharply after Sb incorporation. As the Sbconcentration is further increased (when x=8 at. %) a reverse in the trend has beenobserved for all these parameters. Intensity dependence of photoconductivity has also beenstudied at 303 K and follows a power law as σph ∝ Fγ, where γ lies between 0.5 and 1. Thedifferential life time (τd) is determined from the decay of photocurrent with time. Thedifferential life time increases as the Sb concentration increases upto x = 6 at. %. Theresults are explained on the basis of increase in the density of localized states present inthe mobility gap and in terms of the electron affinity values of the various constituents ofSe-Te-Sb thin films.
机译:研究了通过热蒸发技术制备的Se70Te30-xSbx(x = 0、2、4、6、8)非晶薄膜的电性能。当Sbadditive的浓度增加到x = 6 at时,暗电导率(σd),电荷载流子浓度(nσ)和光电导率(σph)增加。 a-Se70Te30-xSbx薄膜中的百分比。掺入Sb后,活化能(ΔE)和光敏性(σph/σd)急剧下降。随着Sb浓度的进一步增加(当x = 8 at。%时),所有这些参数的趋势都出现了逆转。还在303 K处研究了光导强度的强度依赖性,并遵循幂定律σph∝Fγ,其中γ在0.5到1之间。微分寿命(τd)由光电流随时间的衰减确定。随着Sb浓度增加到x = 6 at,微分寿命延长。 %。基于迁移率间隙中存在的局部状态的密度的增加以及Se-Te-Sb薄膜的各种成分的电子亲和力值来解释结果。

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